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TRACE ELEMENT X-RAY FLUORESCENCE ANALYSER USING DUAL FOCUSING X-RAY MONOCHROMATORS
TRACE ELEMENT X-RAY FLUORESCENCE ANALYSER USING DUAL FOCUSING X-RAY MONOCHROMATORS
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机译:使用双焦点X射线单色仪的痕量X射线荧光分析仪
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摘要
An X-ray fluorescence analyser is provided which comprises: (1) an X-raysourceselected to produce an intense X-ray beam, (2) a first optical element thatfocuses theX-ray beam produced by the X-ray source onto a sample and selects X-rays of adesiredenergy, (3) an energy resolving detector, and (4) a second optical elementthat receivesfluorescent X-rays emitted from elements in the sample and focuses a selectedenergyrange of said fluorescent X-rays onto said energy resolving detector. Each ofthe firstand second optical elements includes a crystal component. The X-rayfluorescenceanalyser is configured such that: (i) the X-ray source has a spot sizedimensioned sothat it is substantially in a field of view of the first optical element, and(ii) the firstoptical element focuses the X-ray beam emitted by the X-ray source onto anarea of thesample that corresponds to a field-of-view of the second optical element.Furthermore,the field of view for an optical element is defined as the area in the sourceplane of therespective crystal component over which X-rays are able to be emitted andstillefficiently be reflected by said optical element.
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