Mapping of Trace Elements with Photon Microprobes: X-Ray Fluorescence with Focussed Synchrotron Radiation

摘要

High energy electron synchrotron storage rings provide copious quantities of polarized photons that make possible the mapping of many trace elements with sensitivities at the parts per billion (ppB) level with spatial resolutions in the micrometer range. The brightness of the x-ray ring of the National Synchrotron Light Source (NSLS), presently being commissioned, will be five orders of magnitude larger than that of the bremsstrahlung spectrum of state-of-the-art rotating anode tubes. We will discuss mapping trace elements with a photon microprobe presently being constructed for use at the NSLS. This microprobe will have micrometer spatial resolution. (ERA citation 10:037458)