DEVICE FOR RESEARCH MATERIALS in a deformed state by atomic force microscopy

摘要

Apparatus for investigating materials in deformed states by atomic force microscope is a mechanism that moves the jaws with fixed sample in opposite directions, on which top fed probe of an atomic force microscope, and contains total metal base fixed to the carriage sample atomic force microscope holder at which the two sides are two parallel fixed guides, which during rotation of the handle screw with respect to the transverse axis divided left and right rez Bami providing simultaneous divergence and approximation, moving the movable clamps, characterized in that the device with a stretching mechanism is in the form incorporated in the atomic force microscope mechanism and thereby approach and retraction of the scanning probe (cantilever) occurs automatically by means of the positioner of the microscope.