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how to fix methods, and the roughness of the patterned resist feature that reduces the surface roughness of the resist feature

机译:如何固定方法以及图案化的抗蚀剂特征的粗糙度会降低抗蚀剂特征的表面粗糙度

摘要

Solutions The method of decreasing the surface roughness of rejisutohuichiya which is provided on the baseplate has the stage which forms the plasma sheath and the plasma to which inside includes the ion. In order the one part which opposes to the inside baseplate of boundary with the plasma and the plasma sheath, not to become parallel to the plane surface which the baseplate demarcates, form of boundary is corrected making use of the plasma sheath correction section. At the time of 1st irradiating, the electromagnetic wave which has the wave length of desire is irradiated to rejisutohuichiya. And, over the angular range of given, exceeding the boundary which has the form after the correcting, directing to rejisutohuichiya, the ion it accelerates. Selective figure Figure 7
机译:解决方案降低基板上设置的rejisutohuichiya的表面粗糙度的方法具有形成等离子体鞘和内部包含离子的等离子体的阶段。为了使与等离子体和等离子体鞘的边界相对的内侧基板的一部分不平行于基板划界的平面,利用等离子体鞘校正部对边界的形状进行校正。在第1次照射时,将具有期望的波长的电磁波照射到rejisutohuichiya。并且,在给定的角度范围内,超过校正后具有形式的边界,将其引导到rejisutohuichiya,它会加速离子。<选择图>图7

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