首页> 外国专利> LINE TESTING DEVICE FOR ARRAY SUBSTRATE HAVING DENSE NUMBER OF WIRES AND METHOD FOR TESTING LINE OF THE ARRAY SUBSTRATE HAVING THE DENSE NUMBER OF WIRES

LINE TESTING DEVICE FOR ARRAY SUBSTRATE HAVING DENSE NUMBER OF WIRES AND METHOD FOR TESTING LINE OF THE ARRAY SUBSTRATE HAVING THE DENSE NUMBER OF WIRES

机译:具有线密度的阵列基质的线测试装置和具有线密度的阵列基质的线测试方法

摘要

A line testing device for an array substrate having a dense number of wires. includes a signal generating device that generates a detection signal, a signal receiving device that receives and processes the detection signal, and a control divice. The detection signal tests the array substrate having the dense number of wires, and the control device controls one or more of the signal generating device and the signal receiving device to move in a direction perpendicular to a direction of a scan line of the array substrate and in a plane parallel to the array substrate.
机译:用于具有大量导线的阵列基板的线测试装置。信号发生器包括产生检测信号的信号产生装置,接收并处理检测信号的信号接收装置以及控制装置。所述检测信号测试具有密集数目的导线的阵列基板,并且所述控制装置控制所述信号产生装置和所述信号接收装置中的一个或多个沿垂直于所述阵列基板的扫描线的方向的方向移动,并且在平行于阵列基板的平面中。

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