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LINE TESTING DEVICE FOR ARRAY SUBSTRATE HAVING DENSE NUMBER OF WIRES AND METHOD FOR TESTING LINE OF THE ARRAY SUBSTRATE HAVING THE DENSE NUMBER OF WIRES
LINE TESTING DEVICE FOR ARRAY SUBSTRATE HAVING DENSE NUMBER OF WIRES AND METHOD FOR TESTING LINE OF THE ARRAY SUBSTRATE HAVING THE DENSE NUMBER OF WIRES
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机译:具有线密度的阵列基质的线测试装置和具有线密度的阵列基质的线测试方法
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摘要
A line testing device for an array substrate having a dense number of wires. includes a signal generating device that generates a detection signal, a signal receiving device that receives and processes the detection signal, and a control divice. The detection signal tests the array substrate having the dense number of wires, and the control device controls one or more of the signal generating device and the signal receiving device to move in a direction perpendicular to a direction of a scan line of the array substrate and in a plane parallel to the array substrate.
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