Semiconductor component - - - test method for a semiconductor component - - - test system with a reduced number of test - channels

摘要

A method for the testing of semiconductors - components, comprising the steps of:Providing an arrangement to be tested with a plurality of semiconductor - components (3a, 3b, 3c, 3d), wherein the semiconductor - components (3a, 3b, 3c, 3d) for performing a for the respective semiconductor - component (3a, 3b, 3c, 3d) individual tests a the corresponding semiconductor - component (3a, 3b, 3c, 3d) is individually characterizing associated identifier, which on the respective semiconductor - component (3a, 3b, 3c, 3d) is transmitted, wherein each semiconductor - component (3a, 3b, 3c, 3d) more than two semiconductor - component - be identified ornamental - terminals (12a, 12b, 12c, 12d, 13a, 13b, 13c, 13d), which in each case different identifiers are associated, which a respective semiconductor - component identifier identifying individually to the corresponding semiconductor - component (3a, 3b, 3c, 3d) is transmitted, that a single signal to each of the semiconductors - components together is transmitted and the signal in the case of each of the semiconductors - components to a single in each case one of the identifier of the remaining semiconductor - components different identifier associated connection is applied.