首页> 外国专利> Single particle detection apparatus using optical analysis, single particle detection method, and computer program for single particle detection

Single particle detection apparatus using optical analysis, single particle detection method, and computer program for single particle detection

机译:利用光学分析的单颗粒检测装置,单颗粒检测方法以及用于单颗粒检测的计算机程序

摘要

There is provided a single particle detection technique based on a scanning molecule counting method, enabling individual detection of a single particle using light measurement with a confocal microscope or multiphoton microscope, and quantitative observation of conditions or characteristics of the particle. The inventive technique of detecting a single particle in a sample solution is characterized by detecting light containing substantially constant background light from a light detection region with moving the position of the light detection region of the microscope in a sample solution to generate time series light intensity data; and detecting individually a light intensity reduction occurred when a single particle which does not emit light (or a particle whose emitting light intensity in a detected wavelength band is lower than the background light) enters in the light detection region in the time series light intensity data as a signal indicating the existence of each single particle.
机译:提供了一种基于扫描分子计数方法的单粒子检测技术,该单粒子检测技术能够使用共聚焦显微镜或多光子显微镜通过光测量对单个粒子进行单独检测,并定量观察粒子的状况或特征。检测样品溶液中单个颗粒的本发明技术的特征在于,通过移动样品溶液中显微镜的光检测区域的位置来检测来自光检测区域的基本恒定的背景光,以产生时间序列光强度数据;分别检测在时间序列光强度数据中不发光的单个粒子(或在检测到的波段中的发光强度低于背景光的粒子)进入光检测区域时发生的光强度降低。作为表示每个单个粒子存在的信号。

著录项

  • 公开/公告号JP6010033B2

    专利类型

  • 公开/公告日2016-10-19

    原文格式PDF

  • 申请/专利权人 オリンパス株式会社;

    申请/专利号JP20130531130

  • 发明设计人 葉梨 拓哉;田邊 哲也;

    申请日2012-05-23

  • 分类号G01N21/64;

  • 国家 JP

  • 入库时间 2022-08-21 14:43:48

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号