A memory block area in a semiconductor memory includes program segments. Each program segment includes a group of memory cells arranged at positions where word lines and bit lines intersect and connected to a common source line. The word lines are shared by the program segments. At program operation time source line switches are used for supplying first voltage to a source line in a program segment, of the program segments, including a memory cell to be programmed and supplying second voltage to a source line in a program segment, of the program segments, not including the memory cell to be programmed.
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