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METHOD FOR CHARACTERIZING A PHOTOVOLTAIC ELEMENT, DEVICE FOR CHARACTERIZING THE PHOTOVOLTAIC ELEMENT, PROGRAM, AND RECORDING MEDIUM THEREOF
METHOD FOR CHARACTERIZING A PHOTOVOLTAIC ELEMENT, DEVICE FOR CHARACTERIZING THE PHOTOVOLTAIC ELEMENT, PROGRAM, AND RECORDING MEDIUM THEREOF
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机译:用于表征光电元件的方法,用于表征光电元件的装置,程序及其记录介质
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摘要
The method for characterizing a photovoltaic element (4) comprises a phase of studying (E1) a behaviour of the photovoltaic element (4) in response to the application of a light beam from a light source (2), for example a matrix of light-emitting diodes, at a study emitting power. Said study phase (E1) comprises a step of measuring (E1-1) at least one electrical parameter (I, V) representative of the operation of the photovoltaic element (4). Furthermore, the method comprises an initialisation phase (E2), performed before the study phase (E1), comprising a step of adjustment (E2-1) of an operating temperature of the light source (2) as a function of the study emitting power.
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