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Method for ranking fault-test pairs based on waveform statistics in a mutation-based test program evaluation system
Method for ranking fault-test pairs based on waveform statistics in a mutation-based test program evaluation system
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机译:基于突变的测试程序评估系统中基于波形统计的故障测试对排序方法
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摘要
Ranking of fault-test pairs is performed using first and second multitudes of waveform statistics. The first multitude of waveform statistics includes first value-change information regarding variations in logics HIGH and LOW for each bit of each reference output resulting from a test run of the design code. The second multitude of waveform statistics includes second value-change information regarding variations in logics HIGH and LOW for each bit of each faulty output resulting from a test run of the design code injected with a fault. Relative differences between the first and second multitudes of waveform statistics for each bit of each faulty output with respect to the corresponding reference output are determined. A waveform difference based on the relative differences for each signal of each faulty output is determined. A ranking result of fault-test pairs is determined according to the waveform differences of the faulty outputs.
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