Defect analysis device, defect analysis system, efect analysis method, and computer readable recording medium

摘要

A defect analysis device includes frequency determining means for determining a first frequency band based on a first vibration occurred at a first point located within a predetermined range from a deployment position of vibration detection means capable of detecting a vibration occurred at a pipe, determining a second frequency band based on a second vibration occurred at a second point located which is different from the first point, and determining a leakage frequency band based on the first frequency band and the second frequency band, and signal processing means for determining a defect between the first point and the second point based on a vibration level of the vibration in the leakage frequency band.