首页> 外国专利> Defect analysis device, defect analysis system, efect analysis method, and computer readable recording medium

Defect analysis device, defect analysis system, efect analysis method, and computer readable recording medium

机译:缺陷分析装置,缺陷分析系统,效应分析方法和计算机可读记录介质

摘要

To highly accurately determine whether there is a defect in a pipe. This defect analysis device has: a frequency determining unit, which determines a first frequency band on the basis of first vibration generated from a first point within a predetermined range from the installation point of a vibration detection unit that is capable of detecting vibration generated in a pipe, determines a second frequency band on the basis of second vibration generated from a second point that is different from the first point, and determines a leakage frequency band on the basis of the first frequency band and the second frequency band; and a signal processing unit that determines a defect between the first point and the second point on the basis of the vibration level of vibration in the leakage frequency band.
机译:为了高度准确地确定管道中是否存在缺陷。该缺陷分析装置具有:频率确定单元,该频率确定单元基于从第一点产生的第一振动来确定第一频带,该第一点在距振动检测单元的安装点的预定范围内的预定范围内,该振动检测单元的安装点能够检测在振动检测单元中产生的振动。管道,基于从不同于第一点的第二点产生的第二振动来确定第二频带,并基于第一频带和第二频带来确定泄漏频带;信号处理单元,其基于泄漏频带中的振动的振动水平来确定第一点和第二点之间的缺陷。

著录项

  • 公开/公告号GB2552108A

    专利类型

  • 公开/公告日2018-01-10

    原文格式PDF

  • 申请/专利权人 NEC CORPORATION;

    申请/专利号GB20170014312

  • 申请日2016-03-22

  • 分类号G01M3/24;G01N29/34;G01N29/48;

  • 国家 GB

  • 入库时间 2022-08-21 12:32:11

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号