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Memory Cells, Memory Cell Programming Methods, Memory Cell Reading Methods, Memory Cell Operating Methods, and Memory Devices

机译:存储器单元,存储器单元编程方法,存储器单元读取方法,存储器单元操作方法和存储器设备

摘要

Embodiments disclosed include memory cell operating methods, memory cell programming methods, memory cell reading methods, memory cells, and memory devices. In one embodiment, a memory cell includes a wordline, a first bitline, a second bitline, and a memory element. The memory element is electrically connected to the wordline and selectively electrically connected to the first bitline and the second bitline. The memory element stores information via a resistive state of the memory element. The memory cell is configured to convey the resistive state of the memory element via either a first current flowing from the first bitline through the memory element to the wordline or a second current flowing from the wordline through the memory element to the second bitline.
机译:公开的实施例包括存储单元操作方法,存储单元编程方法,存储单元读取方法,存储单元和存储设备。在一个实施例中,存储单元包括字线,第一位线,第二位线和存储元件。存储元件电连接到字线并且选择性地电连接到第一位线和第二位线。存储元件经由存储元件的电阻状态存储信息。存储单元被配置为经由从第一位线流经存储元件到字线的第一电流或从字线流经存储元件到第二位线的第二电流来传送存储元件的电阻状态。

著录项

  • 公开/公告号US2018068724A1

    专利类型

  • 公开/公告日2018-03-08

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US201715798166

  • 发明设计人 JUN LIU;

    申请日2017-10-30

  • 分类号G11C13;

  • 国家 US

  • 入库时间 2022-08-21 12:59:01

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