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Power MOSFET having lateral channel, vertical current path, and P-region under gate for increasing breakdown voltage

机译:功率MOSFET具有横向沟道,垂直电流路径以及栅极下方的P区,用于增加击穿电压

摘要

In one embodiment, a power MOSFET cell includes an N+ silicon substrate having a drain electrode. An N-type drift layer is grown over the substrate. An N-type layer, having a higher dopant concentration than the drift region, is then formed along with a trench having sidewalls. A P-well is formed in the N-type layer, and an N+ source region is formed in the P-well. A gate is formed over the P-well's lateral channel and has a vertical extension into the trench. A positive gate voltage inverts the lateral channel and increases the vertical conduction along the sidewalls to reduce on-resistance. A vertical shield field plate is also located next to the sidewalls and may be connected to the gate. The field plate laterally depletes the N-type layer when the device is off to increase the breakdown voltage. A buried layer and sinker enable the use of a topside drain electrode.
机译:在一个实施例中,功率MOSFET单元包括具有漏极的N +硅衬底。在衬底上生长N型漂移层。然后,与具有侧壁的沟槽一起形成具有比漂移区更高的掺杂剂浓度的N型层。在N型层中形成P阱,并且在P阱中形成N +源极区。栅极形成在P阱的横向通道上方,并在沟槽中垂直延伸。正的栅极电压会使横向沟道反相,并增加沿侧壁的垂直传导,以降低导通电阻。垂直屏蔽场板也位于侧壁旁边,并且可以连接到栅极。当器件关闭时,场板横向耗尽N型层以增加击穿电压。掩埋层和沉降片使得能够使用顶侧漏电极。

著录项

  • 公开/公告号US9947779B2

    专利类型

  • 公开/公告日2018-04-17

    原文格式PDF

  • 申请/专利权人 MAXPOWER SEMICONDUCTOR INC.;

    申请/专利号US201715663465

  • 申请日2017-07-28

  • 分类号H01L29/739;H01L29/66;H01L29/06;H01L29/08;H01L29/40;H01L29/78;H01L29/10;H01L29/423;

  • 国家 US

  • 入库时间 2022-08-21 12:58:57

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