Modular device for testing changes in morphology of materials under the impact to shearing forces, in nanometric scale in the electron microscope chambers

摘要

modular device to test materials under the action of forces change the morphology u015bcinaju0105cych, at the nanometric scale in the electron microscopes, contains the u015bcinaju0105cu0105 (2) which is vertical crack on part of the sample (6) test material, applied for suwnie situated centrally in the body (1).in the body (1) is additionally vertical crack on the remainder of the sample (6) located perpendicular to the select on the u015bcinaju0105cu0105 (2). in the (1) device for selection on the u015bcinaju0105cu0105 (2), is made nagwintowany hole, in which is snagged the shank screws (4), which its tractive end is supported against the wall of the cylinder head u015bcinaju0105cej (2).perpendicular to the rift in the test sample (6) in the body (1) is made nagwintowany hole, in which is snagged the shank screws dociskowej (5), which end is placed in the side wall of the slot. in addition, in the (1) of the device is nagwintowany hole, in which is snagged the shank screws mounting feet (3) to attach the device to a table in the microscope.