首页> 外国专利> Dye and pry process for removing quad flat no-lead packages and bottom termination components

Dye and pry process for removing quad flat no-lead packages and bottom termination components

机译:用于去除方形扁平无铅封装和底部端接组件的染色和撬动工艺

摘要

Embodiments of the invention include a dye and pry process for removing quad flat no-lead (QFN) packages and bottom termination components (BTC) from card assemblies. Aspects of the invention include immersing a semiconductor package assembly in a solution comprising dye and placing the immersed semiconductor package assembly under vacuum pressure. Vacuum conditions ensure that the dye solution is pulled into any cracks in the solder formed between the semiconductor package assembly and the QFN package or BTC. The package assembly is dried and a hole is drilled to expose a bottom surface of the QFN package or BTC. The QFN package or BTC is then removed by applying a force to the exposed bottom surface. The semiconductor package assembly can then be inspected for the dye to locate cracks.
机译:本发明的实施例包括用于从卡组件去除四方扁平无铅(QFN)封装和底部终端组件(BTC)的染色和撬动过程。本发明的方面包括将半导体封装组件浸入包含染料的溶液中,并将浸入的半导体封装组件置于真空压力下。真空条件可确保将染料溶液吸入半导体封装组件和QFN封装或BTC之间形成的焊料中的任何裂缝中。封装组件被干燥,并钻一个孔以暴露QFN封装或BTC的底表面。然后,通过对裸露的底面施加力来移除QFN封装或BTC。然后可以检查半导体封装组件中的染料以找到裂纹。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号