首页> 外国专利> Gallium nitride/ aluminum gallium nitride semiconductor device and method of making a gallium nitride/ aluminum gallium nitride semiconductor device

Gallium nitride/ aluminum gallium nitride semiconductor device and method of making a gallium nitride/ aluminum gallium nitride semiconductor device

机译:氮化镓/氮化铝镓半导体器件及制造氮化镓/氮化铝镓半导体器件的方法

摘要

A semiconductor device and a method of making the same is disclosed. The device includes a substrate having an AlGaN layer located on a GaN layer for forming a two dimensional electron gas at an interface between the AlGaN layer and the GaN layer. The device also includes a plurality of contacts. At least one of the contacts includes an ohmic contact portion located on a major surface of the substrate. The ohmic contact portion comprises a first electrically conductive material. The at least one of the contacts also includes a trench extending down into the substrate from the major surface. The trench passes through the AlGaN layer and into the GaN layer. The trench is at least partially filled with a second electrically conductive material. The second electrically conductive material is a different electrically conductive material to the first electrically conductive material.
机译:公开了一种半导体器件及其制造方法。该装置包括衬底,该衬底具有位于GaN层上的AlGaN层,该AlGaN层用于在AlGaN层和GaN层之间的界面处形成二维电子气。该设备还包括多个触点。触点中的至少一个包括位于衬底的主表面上的欧姆接触部分。欧姆接触部分包括第一导电材料。接触件中的至少一个还包括从主表面向下延伸到基板中的沟槽。沟槽穿过AlGaN层并进入GaN层。沟槽至少部分地填充有第二导电材料。第二导电材料是与第一导电材料不同的导电材料。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号