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Copper alloy for electronic/electrical device, plastically-worked copper alloy material for electronic/electrical device, component for electronic/electrical device, terminal, and busbar
Copper alloy for electronic/electrical device, plastically-worked copper alloy material for electronic/electrical device, component for electronic/electrical device, terminal, and busbar
A copper alloy for an electronic and electric device includes: Mg in a range of 0.1 mass % or more and less than 0.5 mass %; and a Cu balance including inevitable impurities, wherein a graph, in which a vertical axis is dσt/dεt and a horizontal axis is a true strain εt, dσt/dεt being defined by a true stress σt and the true strain εt, obtained in a tensile test of the copper alloy, has a strained region that has a positive slope of dσt/dεt.
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机译:用于电子电气设备的铜合金包括:Mg为0.1质量%以上且小于0.5质量%;和包括不可避免的杂质的Cu天平,其中,纵轴为dσ t Sub> /dε t Sub>,横轴为真实应变ε t Sub>,dσ t Sub> /dε t Sub>由真实应力σ t Sub>和真实应变ε t 在铜合金的拉伸试验中获得的Sub>的应变区域的斜率为dσ t Sub> /dε t Sub>。
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