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Three-dimensional memory device having discrete direct source strap contacts and method of making thereof

机译:具有离散的直接源极带状触点的三维存储器件及其制造方法

摘要

A planar material layer stack including a lower etch stop dielectric layer, a sacrificial semiconductor layer, and an upper etch stop dielectric layer is formed over a source semiconductor layer on a substrate. An alternating stack of insulating layers and spacer material layers is formed. The spacer material layers are formed as, or are subsequently replaced with, electrically conductive layers. An array of memory stack structures is formed. A source cavity is formed by removing the sacrificial semiconductor layer and portions of the memory films. Source strap structures are formed by a selective semiconductor deposition process on the vertical semiconductor channels and the source semiconductor layer. A dielectric fill material layer fills a remaining volume of the source cavity.
机译:在衬底上的源极半导体层上方形成包括下蚀刻停止电介质层,牺牲半导体层和上蚀刻停止电介质层的平面材料层堆叠。形成绝缘层和间隔物材料层的交替堆叠。隔离材料层形成为导电层,或随后被导电层代替。形成存储器堆栈结构的阵列。通过去除牺牲半导体层和部分存储膜来形成源腔。通过选择性半导体沉积工艺在垂直半导体沟道和源极半导体层上形成源极带结构。电介质填充材料层填充源腔的剩余体积。

著录项

  • 公开/公告号US10224340B2

    专利类型

  • 公开/公告日2019-03-05

    原文格式PDF

  • 申请/专利权人 SANDISK TECHNOLOGIES LLC;

    申请/专利号US201715626444

  • 申请日2017-06-19

  • 分类号H01L29/792;H01L27/11582;H01L27/1157;H01L27/11524;H01L27/11556;

  • 国家 US

  • 入库时间 2022-08-21 12:09:21

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