首页> 外国专利> MEMS --CMOS A METHOD FOR INTEGRATING COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR CMOS DEVICES WITH MICROELECTROMECHANICAL SYSTEMS MEMS DEVICES USING A FLAT SURFACE ABOVE A SACRIFICIAL LAYER

MEMS --CMOS A METHOD FOR INTEGRATING COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR CMOS DEVICES WITH MICROELECTROMECHANICAL SYSTEMS MEMS DEVICES USING A FLAT SURFACE ABOVE A SACRIFICIAL LAYER

机译:MEMS --CMOS一种在微电子机械系统中集成互补金属氧化物半导体氧化物CMOS器件的方法在牺牲层之上使用平整表面的MEMS器件

摘要

A method of integrating a complementary metal-oxide-semiconductor (CMOS) device with a microelectromechanical system (MEMS) device using a flat surface over a sacrificial layer is provided. In some embodiments, a back-end-of-line (BEOL) interconnect structure covering a semiconductor substrate is formed, where the BEOL interconnect structure includes a first dielectric region. A sacrificial layer is formed on the first dielectric region, and a second dielectric region covering the sacrificial layer and the first dielectric region is formed. Planarization is performed on the upper surface of the second dielectric region to planarize the upper surface of the second dielectric region. A MEMS structure is formed on the flat top surface of the second dielectric region. Cavity etching is performed on the sacrificial layer through the MEMS structure to remove the sacrificial layer and form a cavity in place of the sacrificial layer. An integrated circuit (IC) resulting from the method is also provided.
机译:提供了一种在牺牲层上方使用平坦表面将互补金属氧化物半导体(CMOS)器件与微机电系统(MEMS)器件集成的方法。在一些实施例中,形成覆盖半导体衬底的线后端(BEOL)互连结构,其中,该BEOL互连结构包括第一介电区。在第一介电区上形成牺牲层,并且形成覆盖牺牲层和第一介电区的第二介电区。在第二介电区的上表面上执行平坦化以平坦化第二介电区的上表面。 MEMS结构形成在第二介电区的平坦顶表面上。通过MEMS结构在牺牲层上执行腔蚀刻以去除牺牲层并形成代替牺牲层的腔。还提供了由该方法产生的集成电路(IC)。

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