SCANNING PROBE OF ATOMIC-FORCE MICROSCOPE WITH SEPARABLE TELECONTROL NANOCOMPOSITE EMITTING ELEMENT BASED ON UPCONVERTING AND MAGNETIC NANOPARTICLES OF CORE-SHELL STRUCTURE

摘要

FIELD: measuring equipment.;SUBSTANCE: invention relates to a measuring technique and can be used in atomic force microscopy for diagnosing nanoscale structures. Scanning probe comprises a cantilever connected to a probing needle which is inserted and rigidly fixed in one of the through nanopores of larger-diameter glass sphere with upconverting nanoparticles of the core-shell structure, and the probing needle point, which comes out of the larger-diameter glass sphere, is movably connected by means of two embedded carbon nanotubes with a separable and autonomous functioning polymer small-diameter sphere with through nanopores filled with upconverting nanoparticles and magnetic nanoparticles. Remote control of excitation of upconverting nanoparticles of core-shell structure and their independent movement along coordinate Z during scanning of side walls of nanowells of a biological diagnostic object is carried out using an external excitation source of upconverting nanoparticles and two external oppositely directed synchronized electromagnetic fields.;EFFECT: possibility of scanning nanowells in coordinate Z, depth of which is tens of times greater than the length of the probing needle, with a combination of electromagnetic exposure with an optical wavelength on the walls of nanowells with simultaneous measurement of mechanical characteristics (Young's modulus) on this stimulating effect in one point of the surface of the diagnosed object with coordinates X, Y, without affecting adjacent sections.;1 cl, 3 dwg