Color Supplement to NIST Special Publication 400-93: Semiconductor MeasurementTechnology: Design and Testing Guides for the CMOS and Lateral Bipolar-on-SOI Test Library

摘要

This report is the supplement to the NIST Special Publication entitled,'Semiconductor Measurement Technology: Design and Testing Guides for the CMOS and Lateral Bipolar-on-SOI Test Library.' This supplement contains the complete set of figures from the above mentioned document with the test structures provided in color for easier interpretation.