Electrical Resistivity Response Due to Elastic-Plastic Deformations

摘要

The electrical resistivity of many materials is sensitive to changes in the electronic band configurations surrounding the atoms, changes in the electron-phonon interaction cross-sections, and changes in the density of intrinsic defect structures. These changes are most directly dependent on interatomic measures of relative deformation. For this reason, a model for resistivity response is developed in terms of interatomic measures of relative deformation. The relative deformation consists of two terms, a continuous function to describe the recoverable displacement between two atoms in the atomic lattice structure and a functional to describe the nonrecoverable displacement between two atoms as a result of interatomic discontinuities from dislocation kinetics. This model for resistivity extends the classical piezoresistance representation and relates electric resistance change directly to physical mechanisms. An analysis for the resistivity change of a thin foil ideally embedded in a material that undergoes elastic-plastic deformation is presented. For the case of elastic deformations, stress information in the material surrounding the thin foil is inferred for the cases of pure strain coupling boundary conditions, pure stress coupling boundary conditions, and a combination of stress-strain coupling boundary conditions. 42 refs., 4 figs. (ERA citation 12:027942)