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Oxygen enhancement of 1.54 mu m Er3+ luminescence in hydrogenated amorphous silicon

机译:氢化非晶硅中氧气的1.54μmEr3 +发光增强

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The influence of the hydrogen content and the oxygen content on the luminescence from erbium-implanted hydrogenated amorphous silicon (a-Si:H) is presented. The Er3+-related emission is correlated to the efficiency of Er3+ optical centres with the bandgap variation and was found to depend strongly on the hydrogen content in the films. A direct correlation between the optical gap energy of the semiconductor and the hydrogen film content was observed. Moreover, the direct role played by oxygen impurities in the erbium optical activation was clearly evidenced. This effect is due to the higher oxygen content (1-2 at.%) and to the oxygen incorporation into a-Si:H during low-temperature annealing under an oxygen flow. Thus oxygen incorporation into a-Si:H films considerably enhances the photoluminescence intensity at room temperature and produces an increase in the value of the optical gap up to 2.1 eV. [References: 17]
机译:提出了氢含量和氧含量对from注入的氢化非晶硅(a-Si:H)发光的影响。 Er3 +相关发射与带隙变化与Er3 +光学中心的效率相关,并且被发现强烈依赖于薄膜中的氢含量。观察到半导体的光学间隙能量与氢膜含量之间存在直接相关性。此外,清楚地证明了氧杂质在光活化中的直接作用。该效果是由于较高的氧含量(1-2 at。%)和在氧气流下的低温退火过程中将氧掺入a-Si:H中所致。因此,将氧掺入a-Si:H膜中可显着增强室温下的光致发光强度,并使光学间隙的值增加至2.1 eV。 [参考:17]

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