首页> 外文期刊>PDA journal of pharmaceutical science and technology >Comparison of Different Calculation Approaches for Defining Microbiological Control Levels Based on Historical Data.
【24h】

Comparison of Different Calculation Approaches for Defining Microbiological Control Levels Based on Historical Data.

机译:基于历史数据定义微生物控制水平的不同计算方法的比较。

获取原文
获取原文并翻译 | 示例
           

摘要

During the manufacturing of pharmaceutical drug products, the counts of microorganisms are monitored in the cleanroom environment, water, the product's raw materials, and the final product. This enables manufacturers to ensure that high numbers of microorganisms that may impair the product's microbiological quality are detected before the product is released to the patient. Microbiological control levels must be set to determine at which number a count is considered too high. Exceeding such levels may require an investigation to determine the root cause explaining why such high numbers of microorganisms occurred, and a set of actions should be performed with the aim of eliminating this root cause. In order to really differentiate higher-than-usual counts, microbiological control levels should be based on historical data. In the present work we analyzed different calculation approaches towards that purpose. We used real microbiological data and performed simulation experiments to determine which statistical method could calculate the most realistic control levels that would provide the best prediction for future routine testing. Better predictions would ensure that only significant contaminations lead to an excursion of the microbiological control level, which would avoid wasting resources by investigating non-issues or normal/controlled conditions.
机译:在药品生产过程中,会在洁净室环境,水,产品的原材料以及最终产品中监控微生物的数量。这使制造商能够确保在将产品释放给患者之前,检测到可能损害产品微生物质量的大量微生物。必须设置微生物控制水平,以确定哪个计数被认为过高。超过此水平可能需要进行调查以确定根本原因,以解释为什么会出现如此大量的微生物,并且应采取一系列措施以消除该根本原因。为了真正区分高于正常水平的计数,微生物控制水平应基于历史数据。在本工作中,我们分析了针对此目的的不同计算方法。我们使用了真实的微生物数据并进行了模拟实验,以确定哪种统计方法可以计算出最现实的控制水平,从而为将来的常规测试提供最佳预测。更好的预测将确保只有重大的污染才导致微生物控制水平的偏移,这将避免通过调查非问题或正常/受控条件而浪费资源。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号