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Ultraviolet sensing based on nanostructured ZnO/Si surface acoustic wave devices

机译:基于纳米结构的ZnO / Si表面声波器件的紫外传感

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An ultraviolet (UV) sensor based on nanostructured zinc oxide (ZnO)/Si surface acoustic wave (SAW) devices was studied in this paper. The ZnO films sputtered onto Si (100) substrate showed a preferred (0002) orientation and good photoluminescence emission. For an SAW device with a wavelength of 64 mu m, a frequency downshift of similar to 1.4 kHz was observed for the Rayleigh mode under a UV light intensity of 0.6 mW cm(-2), whereas the frequency downshift for the Rayleigh mode was increased to 8.3 kHz after integrating ZnO nanorods (NRs) in the ZnO/Si SAW devices. For the SAW device with a wavelength of 20 mu m irradiated under a UV light intensity of 0.6 mW cm(-2), a frequency downshift of 25 kHz for the Sezawa mode was obtained compared to a shift of 12 kHz for the Rayleigh mode. After depositing ZnO NRs, the resonant frequency for the Rayleigh mode was increased to 27.4 kHz under the same UV intensity illumination, due to the significant increase in surface-to-volume ratio.
机译:本文研究了一种基于纳米结构的氧化锌(ZnO)/硅表面声波(SAW)器件的紫外线传感器。溅射到Si(100)衬底上的ZnO膜表现出较好的(0002)取向和良好的光致发光发射。对于波长为64μm的声表面波器件,在紫外线强度为0.6 mW cm(-2)的情况下,对于瑞利模式观察到的频率下移类似于1.4 kHz,而对于瑞利模式观察到的频率下移则增加了在将ZnO纳米棒(NRs)集成到ZnO / Si SAW器件中后,最大频率为8.3 kHz。对于在0.6 mW cm(-2)的紫外线下照射的波长为20μm的SAW器件,与瑞利模式的12 kHz偏移相比,Sezawa模式的频率下移为25 kHz。沉积ZnO NR后,由于表面体积比的显着增加,在相同的UV强度照明下,瑞利模式的共振频率增加到27.4 kHz。

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