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Development of high power THz-TDS system based on S-band compact electron linac

机译:基于S波段紧凑型电子直线加速器的大功率THz-TDS系统的开发

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摘要

The high power terahertz (THz)-time domain spectroscopy (TDS) system has been designed based on S-band compact electron linac at Advanced Industrial Science and Technology (AIST). The THz pulse is expected to have the peak power of about 25 kW with frequency range 0.1-2 THz using the 40MeV electron beam which has about 1 nC bunch charge with 300 fs bunch length (rms). The aptitude discussion of the EO sampling method with ZnTe crystal was accomplished to apply to our THz-TDS system. The preliminary experiment of the absorption measurements of P-PPV on the Si wafer has been successfully demonstrated using the 0.1 THz coherent synchrotron radiation (CSR) pulse and W-band rf detector. It is confirmed that the intense of the THz pulse is enough to perform the THz-TDS analysis of the sample on the Si wafer. In near future, the investigation of the un-researched materials will be started in the frequency range 0.1-2 THz with our high power THz-TDS system.
机译:高功率太赫兹(THz)时域光谱(TDS)系统是根据先进工业科学(AIST)的S波段紧凑型电子直线加速器设计的。使用40MeV电子束,THz脉冲的峰值功率在频率范围0.1-2 THz时有望达到约25 kW,该束具有约1 nC束电荷和300 fs束长(rms)。用ZnTe晶体对EO采样方法进行了适当的讨论,以应用于我们的THz-TDS系统。使用0.1 THz相干同步辐射(CSR)脉冲和W波段rf检测器成功地证明了Si晶片上P-PPV吸收测量的初步实验。可以确定的是,太赫兹脉冲的强度足以对硅晶片上的样品进行太赫兹-TDS分析。在不久的将来,我们的大功率THz-TDS系统将在0.1-2 THz的频率范围内开始对未研究材料的研究。

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