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On resonant scatterers as a factor limiting carrier mobility in graphene

机译:在共振散射体上作为限制石墨烯载流子迁移率的因素

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摘要

We show that graphene deposited on a substrate has a non-negligible density of atomic scale defects. This is evidenced by a previously unnoticed D peak in the Raman spectra with intensity of ~1% with respect to the G peak. We evaluated the effect of such impurities on electron transport by mimicking them with hydrogen adsorbates and measuring the induced changes in both mobility and Raman intensity. If the intervalley scatterers responsible for the D peak are monovalent, their concentration is sufficient to account for the limited mobilities currently achievable in graphene on a substrate.
机译:我们表明,沉积在基板上的石墨烯具有不可忽略的原子尺度缺陷密度。拉曼光谱中以前未被注意到的D峰(相对于G峰的强度为〜1%)证明了这一点。我们通过用氢吸附物模拟这些杂质并测量诱导的迁移率和拉曼强度变化来评估这些杂质对电子传输的影响。如果负责D峰的区间间隔散射体是单价的,则其浓度足以解决目前在基板上的石墨烯中可获得的有限迁移率。

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