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Influence of gallium-doped zinc-oxide thickness on polymer light-emitting diode luminescence efficiency

机译:镓掺杂氧化锌厚度对聚合物发光二极管发光效率的影响

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摘要

Conducting atomic force microscopy and scanning surface potential microscopy were used to study the local electrical properties of gallium-doped zinc oxide (GZO) films prepared by pulsed laser deposition (PLD) on a polyimide (PI) substrate. For a PLD deposition process time of 8 min, the root-mean-square roughness, coverage percentage of the conducting regions, and mean work function on the GZO surface were 2.33 nm, 96.6%, and 4.82 eV, respectively. When the GZO/PI substrate was used for a polymer light-emitting diode (PLED), the electroluminescence intensity increased by nearly 20% compared to a standard PLED, which was based on a commercial-ITO/glass substrate.
机译:传导原子力显微镜和扫描表面电势显微镜用于研究通过脉冲激光沉积(PLD)在聚酰亚胺(PI)衬底上制备的掺杂镓的氧化锌(GZO)薄膜的局部电性能。对于8分钟的PLD沉积过程,GZO表面的均方根粗糙度,导电区域的覆盖率和平均功函数分别为2.33 nm,96.6%和4.82 eV。当GZO / PI基板用于聚合物发光二极管(PLED)时,与基于商用ITO /玻璃基板的标准PLED相比,电致发光强度提高了近20%。

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