...
首页> 外文期刊>Microsystem technologies >A position measurement system for precision alignment of roll-to-roll printing and sensitivity analysis of thermal deformation
【24h】

A position measurement system for precision alignment of roll-to-roll printing and sensitivity analysis of thermal deformation

机译:一种用于卷对卷打印精确对准和热变形敏感性分析的位置测量系统

获取原文
获取原文并翻译 | 示例
           

摘要

Roll-to-roll processing in the field of printed electronics is the process of creating electronic circuits or devices on a roll of flexible plastic or metal foil, and it can be used in the manufacture of many products, such as RFID tags, solar cells, and flexible display panels, at a much lower cost than that in the semiconductor lithography process. This process is also more efficient in producing electronic devices in a large volume than semiconductor lithography. As with lithography, roll-to-roll processing also needs to achieve accurate layer-to-layer alignment in fabricating multi-layered circuits or devices. This alignment precision, in fact, is a critical factor in determining the integration and performance of printed electronics. In other words, it is essential to achieve highly precise alignment in roll-to-roll printing for the full commercialization of printed electronics. To that end, this study proposes an alignment pattern that is directly printed on a web as a solution that can enhance the alignment precision in roll-to-roll printing. Based on this, the study also proposes a web position measurement system using optical measurement instruments and verifies its applicability and reliability. Considering the fact that tension on the web and heat generated in the process of curing may deform the web, we conducted experiments and simulations to analyze the measurement sensitivity when the web is actually deformed and we present the results of the study.
机译:印刷电子领域中的卷对卷处理是在柔性塑料或金属箔的卷上创建电子电路或设备的过程,可用于制造许多产品,例如RFID标签,太阳能电池以及柔性显示面板,其成本远低于半导体光刻工艺。与半导体光刻相比,该方法在大批量生产电子设备方面也更有效。与光刻一样,卷对卷处理也需要在制造多层电路或器件时实现精确的层对层对齐。实际上,这种对准精度是确定印刷电子产品的集成度和性能的关键因素。换句话说,在卷对卷印刷中实现高度精确的对准对于印刷电子的全面商业化至关重要。为此,本研究提出了一种对准图案,该对准图案可以直接打印在卷筒纸上,作为一种解决方案,可以提高卷对卷打印的对准精度。基于此,本研究还提出了一种使用光学测量仪器的卷筒纸位置测量系统,并验证了其适用性和可靠性。考虑到幅材上的张力和固化过程中产生的热量可能会使幅材变形,我们进行了实验和模拟分析,以分析幅材实际变形时的测量灵敏度,并介绍了研究结果。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号