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首页> 外文期刊>Micron: The international research and review journal for microscopy >Determination of the surface morphology of gold-decahedra nanoparticles using an off-axis electron holography dual-lens imaging system
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Determination of the surface morphology of gold-decahedra nanoparticles using an off-axis electron holography dual-lens imaging system

机译:使用离轴电子全息双镜头成像系统确定金十面体纳米颗粒的表面形态

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The purpose of this paper is to show surface irregularities in gold decahedra nanoparticles extracted by using off-axis electron holography in a JEOL ARM 200F microscope. Electron holography has been used in a dual-lens system within the objective lenses: main objective lens and objective minilens. Parameters such as biprism voltage, fringe spacing (σ), fringe width (W) and optimum fringe contrast have been calibrated. The reliability of the transmission electron microscope performance with these parameters was carried out through a plug-in in the Digital-Micrograph software, which considers the mean inner potential within the particle leading a precise determination of the morphological surface of decahedral nanoparticles obtained from the reconstructed unwrapped phase and image processing. We have also shown that electron holography has the capability to extract information from nanoparticle shape that is currently impossible to obtain with any other electron microscopy technique.
机译:本文的目的是显示在JEOL ARM 200F显微镜中使用离轴电子全息图提取的金十足金纳米颗粒的表面不规则性。电子全息术已被用于物镜:主物镜和物镜微型镜的双透镜系统中。已经校准了诸如双棱镜电压,条纹间隔(σ),条纹宽度(W)和最佳条纹对比度等参数。通过Digital-Micrograph软件中的插件,可以实现具有这些参数的透射电子显微镜性能的可靠性,该插件考虑了粒子内的平均内部电势,从而可以精确确定由重建得到的十面体纳米粒子的形态表面。展开阶段和图像处理。我们还表明,电子全息术具有从纳米颗粒形状中提取信息的能力,这是目前其他任何电子显微镜技术都无法获得的。

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