...
首页> 外文期刊>Materials transactions >Electrical Resistance Change due to Hydrogenation of Pd and Pd-Ni Thin Films Immersed in Hydrogen-Dissolved Water
【24h】

Electrical Resistance Change due to Hydrogenation of Pd and Pd-Ni Thin Films Immersed in Hydrogen-Dissolved Water

机译:由于浸入氢溶解水中的Pd和Pd-Ni薄膜的氢化而引起的电阻变化

获取原文
获取原文并翻译 | 示例
           

摘要

The Pd and Pd-Ni thin films with an fee structure were prepared by sputtering. The films were immersed in the pure water and the hydrogen-dissolved water alternatively and the electrical resistance of the films was measured during the immersion. The Pd and Pd-Ni thin films possess good sensitivity to hydrogen dissolved in water. The electrical resistance of the films increases in the hydrogen-dissolved water and decreases in the pure water with excellent reproducibility. The electrical resistance change of the Pd-Ni alloy films is smaller than that of the Pd films. Nickel addition improves the response of increase/decrease of the electrical resistance during the immersion in the pure water and the hydrogen-dissolved water. The detailed electrical behavior of the films is investigated in this study.
机译:通过溅射制备具有电荷结构的Pd和Pd-Ni薄膜。将膜交替地浸入纯水和氢溶解的水中,并在浸入过程中测量膜的电阻。 Pd和Pd-Ni薄膜对溶解在水中的氢具有良好的敏感性。膜的电阻在氢溶解水中增加,而在纯水中则下降,再现性极好。 Pd-Ni合金膜的电阻变化小于Pd膜的电阻变化。镍的添加改善了在纯水和氢溶解的水中浸没期间电阻的增加/减少的响应。在这项研究中研究了薄膜的详细电学行为。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号