Microwave Dielectric Properties of Diopside-Enstatite Glass-Ceramics

摘要

Relationship between the crystallization behaviour and microwave dielectric properties of (l-x)MgSiO_3-xCaMgSi_2O_6 glass-ceramics was investigated as a function of the CaMgSi_2O_6 content. The degree of crystallization of glass-ceramics specimens depended on the CaMgSi_2O_6 content and was evaluated by X-ray diffraction analysis with a combination ofRietveld and reference intensity ratio methods. The dielectric constant (K) and the quality factor (Qf) of the specimens increased with increasing CaMgSi_2O_6 content. These results could be attributed to the dependence of K and Qf on the degree of crystallization. Effect of the crystallite size of the specimens on their microwave dielectric properties is also discussed.