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首页> 外文期刊>Environmental and molecular mutagenesis. >Expression of DNA repair and apoptosis genes in mitochondrial mutant and normal cells following exposure to ionizing radiation.
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Expression of DNA repair and apoptosis genes in mitochondrial mutant and normal cells following exposure to ionizing radiation.

机译:暴露于电离辐射后,线粒体突变体和正常细胞中DNA修复和凋亡基因的表达。

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In double-strand DNA damage repair, nonhomologous end joining (NHEJ) is more error-prone than homologous recombination repair (HRR), indicating that the relative prevalence of NHEJ may lead to more incorrect repair and thus to increases in chromosome damage. If DNA damage is extensive and cells are unable to repair that damage they typically undergo apoptosis. The mechanism(s) by which cells decide to switch from DNA repair to apoptosis is unknown. Since DNA repair and apoptosis are both energy-demanding processes, the answer may involve ATP utilization. We used human mitochondrial mutant cell lines obtained from people with phenotypic manifestations of compromised ATP generation. We hypothesized that these cells may not have adequate capacity for dealing with the additional demands for ATP required for repairing DNA damage after genotoxic exposure, perhaps making the cells more prone to undergo apoptosis instead of initiating repair. This study describes changes in the expression of genes involved in NHEJ or HRR, as well as genes involved in apoptosis, in one normal and two mitochondrial mutant human cell lines following ionizing radiation exposure. Compared to normal cells, both mutant cell lines showed reduced expression of genes involved in NHEJ and HRR. Analysis of expression changes in genes involved in apoptosis revealed marked increases in expression in the mutants compared to normal cells. These results indicate that following ionizing radiation exposure, mitochondrial mutant cells have decreased levels of mRNA expression of DNA repair genes and increased expression levels of genes involved in apoptosis compared to normal cells. This study provides information that might be useful in characterizing energy dependent processes following exposure to stress or genotoxic agents.
机译:在双链DNA损伤修复中,非同源末端连接(NHEJ)比同源重组修复(HRR)更容易出错,这表明NHEJ的相对患病率可能导致更不正确的修复,从而增加染色体损伤。如果DNA损伤广泛且细胞无法修复该损伤,则它们通常会发生凋亡。细胞决定从DNA修复转变为凋亡的机制尚不清楚。由于DNA修复和细胞凋亡都是能量需求过程,因此答案可能涉及ATP的利用。我们使用了人类线粒体突变细胞系,这些细胞系得自具有ATP生成受损的表型表现的人。我们假设这些细胞可能没有足够的能力来处理遗传毒性暴露后修复DNA损伤所需的ATP额外需求,也许使细胞更倾向于发生凋亡而不是开始修复。这项研究描述了一种正常和两种线粒体突变型人细胞在电离辐射暴露后,与NHEJ或HRR相关的基因表达以及与凋亡相关的基因表达的变化。与正常细胞相比,两种突变细胞系均显示出与NHEJ和HRR相关的基因表达减少。分析涉及凋亡的基因的表达变化,发现与正常细胞相比,突变体的表达显着增加。这些结果表明,与正常细胞相比,电离辐射暴露后,线粒体突变细胞的DNA修复基因的mRNA表达水平降低,而涉及凋亡的基因表达水平升高。这项研究提供的信息可能有助于表征暴露于压力或遗传毒性剂后的能量依赖过程。

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