Wavelet based fault detection in analog VLSI circuits using neural networks

摘要

This paper deals with a new method of testing analog VLSI circuits, using wavelet transform for analog circuit response analysis and artificial neural networks (ANN) for fault detection. Pseudo-random patterns generated by Linear Feedback Shift Register (LFSR) are used as input test patterns. The wavelet coefficients obtained for the fault-free and faulty cases of the circuits under test (CUT) are used to train the neural network. Two different architectures, back propagation and probabilistic neural networks are trained with the test data. To minimize the neural network architecture, normalization and principal component analysis are done on the input data before it is applied to the neural network. The proposed method is validated with two IEEE benchmark circuits, namely, the operational amplifier and state variable filter.