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Applications of surface analytical techniques for study of the interactions between mercury and fluorescent lamp materials

机译:表面分析技术在研究汞与荧光灯材料之间相互作用中的应用

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摘要

Several surface analytical techniques, including electron spectroscopy for chemical analysis (ESCA) (X-ray photoelectron spectroscopy) and sputtered neutral mass spectrometry (SNMS), were used to study the interaction between Hg and other components of fluorescent lamps, a very critical issue in lighting industries. Active sites, responsible for Hg interaction/deposition, can be successfully identified by comparing the x-y distribution (obtained by ESCA mapping) and depth distribution (available through SNMS) of respective lamp components with that of Hg. A correlation in both depth and x-y distribution is strong evidence of site preference for Hg interaction/deposition. A burial mechanism is, however, proposed when only depth distribution, not x-y, is correlated. Other modes of ESCA (high resolution, angle-resolved, etc.) were also helpful. Information about the valence states of the interacted Hg species would help to define the nature of the interaction.
机译:几种表面分析技术,包括化学分析用电子光谱法(ESCA)(X射线光电子能谱法)和溅射中性质谱法(SNMS),用于研究汞与荧光灯其他成分之间的相互作用,这是荧光灯中一个非常关键的问题。照明行业。通过将各个灯组件的x-y分布(通过ESCA映射获得)和深度分布(可通过SNMS获得)与Hg的x-y分布(可通过SNMS获得),可以成功地识别出负责Hg相互作用/沉积的活动部位。深度和x-y分布之间的相关性是站点优先考虑汞相互作用/沉积的有力证据。但是,当仅关联深度分布而不关联x-y时,提出了掩埋机制。 ESCA的其他模式(高分辨率,角度分辨等)也很有用。有关相互作用的汞物种的价态的信息将有助于定义相互作用的性质。

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