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首页> 外文期刊>Carbon: An International Journal Sponsored by the American Carbon Society >Surface and in-depth distribution of sp(2) and sp(3) coordinated carbon atoms in diamond-like carbon films modified by argon ion beam bombardment during growth
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Surface and in-depth distribution of sp(2) and sp(3) coordinated carbon atoms in diamond-like carbon films modified by argon ion beam bombardment during growth

机译:SP(2)和SP(3)在生长期间由氩离子束轰击改性的金刚石状碳膜中的SP(2)和SP(3)配位碳原子的表面和深度分布

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Carbon atom coordination at diamond-like carbon (DLC) film surfaces and in sub-surface regions has been determined nondestructively from high-energy resolved C 1s photoelectron spectra, X-ray induced C KVV Auger electron spectra, and angular-resolved C 1s spectra (ARXPS) aided by maximum entropy method (MEM). The spectra were recorded from hydrogen-free DLC films prepared by a pulsed laser deposition under medium energy Ar ion beam assisted growth. The sp(3) and sp(2) fractions determined from C 1s and C KVV spectra recorded at the normal emission angle differ substantially. This indicates an inhomogeneous depth-resolved distribution of the fractions. The result is validated by the analysis of angular-resolved C 1s spectra using the MEM approach. In-depth reconstructions of the carbon bonding states show that sp(2) coordination is dominant at the surfaces. We found that Ar ion beam assisted growth induces a C sp(2) peak beneath the surface. The peak shifts towards the surface and is growing with Ar ion energy. C sp(3) hybridization is dominant in deeper layers. The in-depth reconstruction is further supported by the depth-dependent mass density determined from the low-loss electron spectra excited at various primary electron energy. The results are discussed within the subplantation model. (C) 2018 Elsevier Ltd. All rights reserved.
机译:碳原子配位在金刚石状碳(DLC)膜表面和副表面区域中已经从高能分辨的C 1S光电子谱,X射线诱导的C kVV螺旋电子谱和角度分辨的C 1S光谱确定(ARXPS)通过最大熵方法(MEM)辅助。通过通过在介质能量AR离子束辅助生长的脉冲激光沉积中由脉冲激光沉积制备的无氢DLC膜中记录光谱。在正常发射角记录的C 1S和C kVV光谱中测定的SP(3)和SP(2)级分数基本不同。这表明级分的不均匀深度分配。通过使用MEM方法分析角度分辨的C 1S光谱来验证结果。碳粘接状态的深入重建显示SP(2)的协调在表面上显着。我们发现AR离子束辅助生长在表面下方引起C SP(2)峰值。峰值朝向表面移动并随着AR离子能量而增长。 C SP(3)杂交在更深层中占主导地位。通过在各种原代电子能量激发的低损耗电子光谱中确定的深度依赖性质量密度进一步支持深入的重建。结果在沉膜模型中讨论。 (c)2018年elestvier有限公司保留所有权利。

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