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首页> 外文期刊>Journal of the Optical Society of America, A. Optics, image science, and vision >Super-resolution reconstruction of speckle phase in depth-resolved wavelength scanning interference using the total least-squares analysis
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Super-resolution reconstruction of speckle phase in depth-resolved wavelength scanning interference using the total least-squares analysis

机译:使用总对正方形分析的深度分辨波长扫描干扰在深度分辨波长扫描干扰中的超分辨率重构

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摘要

Depth-resolved wavelength scanning interferometry (DRWSI) is a tomographic imaging tool that employs phase measurement to visualize micro-displacement inside a sample. It is well known that the depth resolution of DRWSI is restricted by a wavelength scanning range. Recently, a nonlinear least-squares analysis (NLS) algorithm was proposed to overcome the limitation of the wavelength scanning range to achieve super-resolution; however, the NLS failed to measure speckle surfaces owing to the sensibility of initial values. To the best of our knowledge, the improvement of depth resolution on measuring a speckle surface remains an open issue for DRWSI. For this study, we redesigned the signal processing algorithm for DRWSI to refine the depth resolution when considering the case of speckle phase measurement. It is mathematically shown that the DRWSI's signal is derived as a model of total least-squares analysis (TLSA). Subsequently, a super-resolution of the speckle phase map was obtained using a singular value decomposition. Further, a numerical simulation to measure the micro-displacements for speckle surfaces was performed to validate the TLSA, and the results show that it can precisely reconstruct the displacements of layers whose depth distance is 5 mu m. This study thus provides an opportunity to improve the DRWSI's depth resolution. (c) 2019 Optical Society of America.
机译:深度分辨的波长扫描干涉测量法(DRWSI)是一种断层摄像工具,采用相位测量来可视化样本内的微位移。众所周知,DRWSI的深度分辨率受波长扫描范围的限制。最近,提出了一种非线性最小二乘分析(NLS)算法来克服波长扫描范围的限制,以实现超分辨率;但是,由于初始值的可感性,NLS未能测量散斑表面。据我们所知,对测量散斑表面的深度分辨率的提高仍然是DRWSI的开放问题。对于本研究,我们重新设计了DRWSI的信号处理算法,以便在考虑散斑相位测量的情况时改进深度分辨率。在数学上表明,DRWSI的信号被推导为全部最小二乘分析的模型(TLSA)。随后,使用奇异值分解获得斑点相位图的超分辨率。此外,执行用于测量斑点表面的微位移的数值模拟以验证TLSA,结果表明它可以精确地重建深度距离为5μm的层的位移。因此,这项研究提供了提高DRWSI深度分辨率的机会。 (c)2019年光学学会。

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