首页> 外文期刊>Journal of the European Ceramic Society >Structure, spectral analysis and microwave dielectric properties of novel x(NaBi)(0.5)MoO4-(1-x)Bi2/3MoO4 (x=0.2 similar to 0.8) ceramics with low sintering temperatures
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Structure, spectral analysis and microwave dielectric properties of novel x(NaBi)(0.5)MoO4-(1-x)Bi2/3MoO4 (x=0.2 similar to 0.8) ceramics with low sintering temperatures

机译:具有低烧结温度的新型X(NABI)(0.5)MOO4-(1-X)BI2 / 3MOO4(X = 0.2的微波介电性能,具有低烧结温度

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Herein, the x(NaBi)(0.5)MoO4-(1-x)Bi2/3MoO4, (xNBM-(1-x)BMO, x = 0.2 similar to 0.8) microwave dielectric ceramics with low sintering temperatures were prepared via the traditional solid-state method to adjust the i f value and dielectric constant. The crystal structure was determined using X-Ray diffraction and Raman spectroscopy, the microstructure was investigated using scanning electron micrograph and energy disperse spectroscopy, and the dielectric properties were studied using a network analyser and infrared spectroscopy. For the xNBM-(1-x)BMO composite ceramics, the (NaBi)(0.5)MoO4 tetragonal phase coexisted with the Bi2/3MoO4 monoclinic phase. With the rise of x value, the permittivity increased from 23.7-29.8, and the tau(f) value shifited from -53.3 ppm/degrees C to -13.7 ppm/degrees C. The 0.8NBM-0.2BMO ceramic sintered at 680 degrees C possessed excellent microwave dielectric properties with a epsilon(r) = 29.8 (6.7 GHz), a Qf = 11,800 GHz, and a tau(f) = -13.7 ppm/degrees C. These results made the xNBM-(1-x)BMO composite ceramics great candidates in low temperature co-fired ceramics technology.
机译:这里,通过传统制备具有低烧结温度的X(NaBi)(0.5)MOO4-(1-X)BI2 / 3MO4,(XNBM-(1-X)BMO,X = 0.2),具有低烧结温度的微波介质陶瓷。固态方法调整IF值和介电常数。使用X射线衍射和拉曼光谱法测定晶体结构,使用扫描电子显微照片和能量分散光谱研究微观结构,并使用网络分析仪和红外光谱研究介电性能。对于XNBM-(1-X)BMO复合陶瓷,(NABI)(0.5)MOO4四方相与BI2 / 3MOO4单斜相的共同。随着X值的升高,介电常数从23.7-29.8增加,TAU(F)值会从-53.3 ppm /℃下换至-13.7ppm /℃。0.8nbm-0.2bmo陶瓷在680℃下烧结具有ε(R)= 29.8(6.7GHz),QF = 11,800GHz的优异微波介电性能,A QF = 11,800GHz,TAU(F)= -13.7ppm /℃。这些结果使XNBM-(1-X)BMO具有低温共铸陶瓷技术复合陶瓷伟大的候选者。

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