首页> 外文期刊>Journal of Materials Chemistry, C. materials for optical and electronic devices >Significant field emission enhancement in ultrathin nano-thorn covered NiO nano-petals
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Significant field emission enhancement in ultrathin nano-thorn covered NiO nano-petals

机译:超薄纳米刺覆盖NIO纳米花瓣的显着场发射增强

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摘要

A power efficient and stable field emission (FE) has been reported here from ultrathin nanothorn covered nickel oxide (NiO) nanopetals (NPs) fabricated using a simple hydrothermal technique. Three orders of magnitude improved electron FE, in terms of threshold and turn-on fields, has been observed from these NiO-NPs. Uniform and vertically aligned NiO-NP structures, grown on a very flat conducting surface (FTO coated glass), show sharp needle like structures on the top edges of the flakes. These ultrafine structures play the main role in FE starting at such a low turn on field. A field enhancement factor of approximately five million and threshold field of 3 V mm(-1) has been estimated by analyzing the FE data (J-E plot) within the framework of Fowler-Nordheim (FN). Modification in device geometry and surface micro-(nano-) structure has been found to play the key role in addressing the bottlenecks in achieving an efficient FE.
机译:这里已经从超薄纳米覆盖的氧化镍(NIO)纳米级(NIO)使用简单的水热技术制造的氧化镍氧化物(NPS)报告了功率效率和稳定的场发射(Fe)。 在这些NIO-NPS中观察到阈值和导通场的三个数量级改善的电子FE。 在非常平坦的导电表面(FTO涂覆玻璃)上生长的均匀和垂直对齐的NIO-NP结构,显示薄片上的锋利针状结构。 这些超细结构在Fe开始以这种低开启场开始发挥主要作用。 通过分析Fowler-Nordheim(FN)框架内的FE数据(J-E PLOT),估计了大约五百万和阈值字段的场增强因子。 已经发现在设备几何和表面微观(纳米)结构中的修改在解决了实现有效Fe的瓶颈方面发挥着关键作用。

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