Quality evaluation of near isogenic lines of the wheat variety carrying Sr26, Lr19 and Yr10 genes

摘要

To study possible effects of the three near isogenic lines (NILs) carrying genes, Sr26, Lr19 and Yr10, a collection of BC2F6 lines containing each of the genes singly were grown in a randomized complete block design with two replications (plot size 7.2 m(2)) for two successive years in the same location. Data were collected on grain yield and 20 flour quality traits and were statistically compared (SPSS version) to understand the effect of the transferred segment on these traits, if any. Thousand kernel weight of the lines carrying Sr26 and Yr10 was reduced significantly while that for the line carrying Lr19 increased significantly. Sr26 NIL had grain yield decrease by 12.5% while the other two were on par with the recurrent parent (RP). Protein content, gluten index, sedimentation value, solvent retention capacities were also decreased significantly in Sr26 NIL Dough development time and dough stability of the three NILs increased significantly but it was the highest for the line carrying Lr19. Sr26 NIL, showed a drop in farinograph quality number due to higher degree of softening as compared to RP. Lr19 NIL did not differ in flour colour from RP and no yellowness of flour was observed. Generally Lr19 and Yr10 carrying lines are without any detrimental effects on yield and quality. Sr26 appears to be carrying linkage drag as it showed an adverse effect on yield and quality. Screening thousands of backcrossed plants with molecular markers in the vicinity of Sr26 may help recover some with RP genome and overcome the adverse effects associated with this introgression.