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Pasting properties modeling and comparative analysis of starch exposed to ionizing radiation

机译:粘贴淀粉暴露于电离辐射的特性建模与对比分析

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The paper presents a comparative analysis and the modeling of the behavior of the viscosities associated with the pasting profile of starches subjected to ionizing radiation processing in the range of 0-20 kGy. The study was performed using both experimental data reported in literature over the last decade and the authors' experimental data. Thus, a mathematical model describing the exponential decrease of the viscosities as the increasing of irradiation dose was proposed. As a result, the values of irradiation dose specific to each starch for each viscosity of pasting profile were determined. These specific irradiation doses are strongly related to the starch sensitivity to irradiation, being influenced by the native starch characteristics (moisture, content, amylose proportion, relative crystallinity and crystallographic pattern). The verification of the model was performed by new experiments of electron beam irradiation on maize starch with irradiation doses up to 20 kGy at a dose rate of 2 kGy/min. Also, an algorithm for the practical use of the developed model and the specific irradiation dose was described.
机译:本文呈现了与在0-20kGy范围内进行电离辐射加工的淀粉的粘贴曲线相关的粘度行为的比较分析和建模。该研究是使用在过去十年和作者的实验数据中文献中报告的两种实验数据进行的。因此,提出了一种数学模型,其描述了作为辐照剂量增加的粘度的指数降低。结果,确定了对每个粘度的每种淀粉的辐射剂量的值。这些特定的辐射剂量与淀粉敏感性强烈有关的辐射,受天然淀粉特性的影响(水分,含量,淀粉糖比例,相对结晶度和晶体图案)。通过玉米淀粉对玉米淀粉的新实验进行模型的验证,用辐照剂量为2kGy / min的剂量率高达20kGy。此外,描述了一种用于实际使用开发模型和特定辐射剂量的算法。

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