Defect formation processes in the silicon nanoparticles under the neutron irradiation

摘要

Silicon nanoparticles have been irradiated by neutrons up to 20 h. Free electrons and defects in the nanosilicon particles have been comparatively investigated before and after neutron irradiation using electron paramagnetic resonance (EPR) method. The neutron scattering and capture cross-section processes have been calculated for natural Si-28(14), Si-29(14), Si-30(14) isotopes, which are main part of nanosilicon samples when irradiated for 20 h by epithermal neutrons. Particle size, agglomeration and other surface effects of silicon nanoparticles were studied with scanning electron microscope (SEM) before and after neutron irradiation.