Exploring the Scanning Probe: A SimpleHands-on Experiment Simulating theOperation and Characteristics of the AtomicForce Microscope

摘要

A simple yet effective model atomic force microscope ispresented for the purpose of introducing students to the fieldof scanning probe microscopy. The model is used todemonstrate the basic characteristics of the atomic forcemicroscope by realistically simulating the operation of theactual instrument. Students acquire data by first using themodel to scan small objects, then use a spreadsheet program togenerate one, two and three-dimensional images based on thescan data. Comparisons between these images and thephysical objects allow students to immediately observe howvarious instrumental parameters, or changes in parameters,such as sampling number or tip size, affect the resultantimages. Differences in the observed images can then be usedto promote discussion on other important topics such as imagecalibration, lateral vs. vertical resolution and tip effects.