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首页> 外文期刊>Acta Technica CSAV >TRANSMISSION ELECTRON MICROSCOPY OF PLASMA SPRAYED CERAMIC DEPOSITS
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TRANSMISSION ELECTRON MICROSCOPY OF PLASMA SPRAYED CERAMIC DEPOSITS

机译:等离子体喷涂陶瓷沉积层的透射电镜

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摘要

Microstructure of plasma sprayed deposits is usually very complex containing solidified lamellas, microcracks, unmelted particles and small voids. Internal structure of solidified lamellas is often composed of narrow columnar grains or can be amorphous. A powerful tool to study fine microstructures of the coatings and the complexities of the substrate/coating interfaces is the Transmission electron microscope. However, preparation of electron transparent foils, which require thickness below 500 mm, is very difficult especially in case of ceramic coatings on metal substrates. Traditional sample preparation techniques rely on extended ion-milling that tends to generate ion-induced artifacts in the samples. The modified wedge polishing technique introduced in the paper significantly reduces the time required for final ion-milling step. Several samples prepared by the wedge polishing method are documented.
机译:等离子喷涂沉积物的微观结构通常非常复杂,其中包含凝固的薄片,微裂纹,未熔化的颗粒和小的空隙。凝固的薄片的内部结构通常由狭窄的圆柱状晶粒组成,或者可以是无定形的。透射电子显微镜是研究涂层细微结构和基材/涂层界面复杂性的有力工具。然而,制备要求厚度小于500mm的电子透明箔是非常困难的,特别是在金属基底上的陶瓷涂层的情况下。传统的样品制备技术依赖于扩展的离子铣削,这往往会在样品中产生离子诱导的假象。本文采用的改进的楔形抛光技术大大减少了最终离子铣削步骤所需的时间。记录了用楔形抛光法制备的几个样品。

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