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首页> 外文期刊>International Journal of Applied Engineering Research >An Optical Control System Based on Received Intensities from an Optical Sensor
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An Optical Control System Based on Received Intensities from an Optical Sensor

机译:一种基于光学传感器的接收强度的光学控制系统

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摘要

Optical fiber sensors have attained lots of attention due to its light weight, small volume, and high precision. The optical sensors can measure a variety of physical quantities, such as temperature, pressure, strain, etc. However, some optical sensor systems require wavelength measuring instrument which is difficult for precise alignment, sensitive to mechanical impact, and large volume to install. An optical sensor system is proposed, which does not require an optical wavelength analyzing instrument. The proposed system stores the intensity for each wavelength of an optical source to eliminate the wavelength analyzing instrument. The optical intensity data can be used to identify the corresponding wavelength, because each wavelength of an optical source has different intensity. In the proposed system, wavelengths incident on detectors are identified using received intensities through wavelength vs. intensity table on the control unit. The wavelength which is converted from the intensity received by the detector in our system reflects the current physical quantity state. Base on the state estimated by the wavelength, the proposed system can control the physical quantity to the desired value. The proposed system is extended to limit a physical quantity variation within a pre-determined range employing a high pass filter and a low pass filter, and monitoring the intensities on detectors in the system. An optical control algorithm for the proposed system is suggested. The proposed system is simple to align, resistant to exterior impact, and easy to maintain in real applications.
机译:由于其重量轻,体积小和高精度,光纤传感器已经达到了很多关注。光学传感器可以测量各种物理量,例如温度,压力,应变等。然而,一些光学传感器系统需要波长测量仪器,这难以精确对准,对机械冲击敏感,以及大容量安装。提出了光学传感器系统,其不需要光学波长分析仪器。所提出的系统存储光源的每个波长的强度,以消除波长分析仪器。光学强度数据可用于识别相应的波长,因为光源的每个波长具有不同的强度。在所提出的系统中,使用通过控制单元上的波长与强度表的接收强度识别入射在探测器上的波长。从我们系统中检测器接收的强度转换的波长反映了当前物理量状态。基于由波长估计的状态,所提出的系统可以将物理量控制到所需的值。所提出的系统扩展以限制采用高通滤波器和低通滤波器的预定范围内的物理量变化,并监测系统中检测器的强度。建议了一种用于所提出的系统的光学控制算法。建议的系统易于对齐,耐外部撞击,易于维护真实应用。

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