首页> 外文期刊>Advanced Powder Technology: The internation Journal of the Society of Powder Technology, Japan >I-V characteristics of the contact interface in a semiconductive BaTiO_3-In composite particle
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I-V characteristics of the contact interface in a semiconductive BaTiO_3-In composite particle

机译:BaTiO_3-In半导体复合颗粒中接触界面的I-V特性

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摘要

The authors previously fabricated semiconductive BaTiO_3-In composite particles. The aggregate could be used as a new positive temperature coefficients (PTC) material, which could be used in arbitrary shapes, differing from the conventional rigid PTC materials. In the composite particle, the interface between the semiconductive BaTiO_3 particles and indium particles plays an important role. In this work I-V characteristics of the interface are investigated in detail. The conclusions obtained in ths research are as follows. (1) The existence of indium particles at the interface between two semiconductive BaTiO_3 particles lowered the electric resistance markedly. This effect was ascribed to the good plasticity and a low value of the work function of indium. (2) In-Ga eutectic liquid alloy and physically vapor-deposited indium film satisfied Ohm's law and did not form a Schottky barrier at the interface with the semiconductive BaTiO_3 material. (3) Physically vapor-deposited gold film formed a high electric resistance at the interface with the semiconductive BaTiO_3 material. This high resistance might be caused by Schottky barrier.
机译:作者先前制造了半导体BaTiO_3-In复合颗粒。骨料可以用作新的正温度系数(PTC)材料,可以以任意形状使用,与传统的刚性PTC材料不同。在复合颗粒中,半导体BaTiO_3颗粒与铟颗粒之间的界面起着重要作用。在这项工作中,对接口的I-V特性进行了详细研究。本研究得出的结论如下。 (1)在两个半导体BaTiO_3颗粒之间的界面处存在铟颗粒显着降低了电阻。这种作用归因于铟的良好可塑性和较低的功函数值。 (2)In-Ga共晶液态合金和物理气相沉积的铟膜满足欧姆定律,并且在与半导体BaTiO_3材料的界面处未形成肖特基势垒。 (3)物理气相沉积的金膜在与半导体BaTiO_3材料的界面处形成高电阻。这种高电阻可能是由肖特基势垒引起的。

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