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首页> 外文期刊>Crystallography reports >Specific Features of the Formation of Dislocation Structure in Gallium Arsenide Single Crystals Obtained by the Czochralski Method
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Specific Features of the Formation of Dislocation Structure in Gallium Arsenide Single Crystals Obtained by the Czochralski Method

机译:通过Czochralski方法获得的砷化镓单晶脱位结构形成的具体特征

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摘要

The influence of the deviation of seed orientation from the [100] direction on the formation of a dislocation structure of gallium arsenide single crystals grown by the Czochralski method has been revealed. The intensive multiplication of dislocations and formation of a block structure occur at deviation by an angle of more than 3A degrees in the region that is radially shifted to one of crystal sides. The linear density of dislocations in the walls changes from 1 x 10(4) cm(-1) in low-angle boundaries to 6 x 10(4) cm(-1) in subboundaries.
机译:已经揭示了从Czochralski方法生长的[100]方向上[100]方向对[100]方向上的[100]方向的影响。 脱位和形成块结构的密集乘法在径向移位到晶体侧的区域中的大于3A度的角度差异。 壁中的脱位的线性密度在亚oudboundaries中的低角度边界中的1×10(4 )cm(-1)变为6×10(4)厘米(-1)。

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