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首页> 外文期刊>Physical review, B >Ferroelastic domain motion by pulsed electric field in (111)/(11(1)over-bar) rhombohedral epitaxial Pb(Zr0.65Ti0.35)O-3 thin films: Fast switching and relaxation
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Ferroelastic domain motion by pulsed electric field in (111)/(11(1)over-bar) rhombohedral epitaxial Pb(Zr0.65Ti0.35)O-3 thin films: Fast switching and relaxation

机译:(111)/(11(1)覆盖物)菱形外延PB(Zr0.65Ti0.35)O-3薄膜:快速切换和放松的脉冲电场

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摘要

Reversible electric-field induced domain switching in ferroelectric thin films gives rise to a large electromechanical coupling. Despite extensive in situ studies confirming a dominant contribution from domain switching, the speed of the domain wall motion had not been discussed enough. In this study, we performed time-resolved measurement of lattice elongation and non-180 degrees domain switching for an epitaxial rhombohedral (111)/(11 (1) over bar)-oriented (Pb(Zr0.65Ti0.35)O-3 film under nanosecond electric field pulses by means of synchrotron x-ray diffraction. Both lattice elongation and non-180 degrees domain switching due to a 200-ns electric pulse were directly observed from the shift of the 222 diffraction position toward a lower angle and the change in the integrated intensity ratio of 222 to 22 (2) over bar peaks, respectively. The non-180 degrees domain switching also results in an increase of the switchable polarization. Following the removal of the electric field, it is seen that the non-180 degrees domain back switching from 222 to 22 (2) over bar is sluggish compared to the relaxation of the field-induced lattice strain. This is different from the (100)/(001)-oriented tetragonal epitaxial Pb(Zr, Ti)O-3 films, in which no obvious delay was detected. These results show the importance of the direct time-resolved response observation of the crystal structure change with the application of a high-speed electric pulse field to understand the frequency dispersion of the ferroelectric and piezoelectric responses of Pb(Zr, Ti)O-3 films.
机译:铁电薄膜中可逆电场诱导域切换产生了大的机电耦合。尽管原位研究很广泛,但尚未讨论域墙运动的速度足以讨论足够的贡献。在这项研究中,我们对外延rhombohedral(111)/(11(1)上方的外延rhombohedral(111)/(11(1))的晶格伸长率和非180度域切换的时间分辨测量(PB(Zr0.65Ti0.35)O-3通过同步X射线衍射在纳秒电场脉冲下的薄膜。从222衍射位置朝向较低角度的偏移,晶格伸长率和由于200-ns电脉冲的非-180度域切换。分别在Bar峰值上的集成强度比的变化为222到22(2)。非180度域切换也导致可切换偏振的增加。在去除电场之后,可以看到非与野外诱导的晶格菌株的松弛相比,从222到22(2)的-180度域反向切换为稳定性。这与(100)/(001)的四字体外延Pb(Zr,Ti)不同)O-3薄膜,没有明显延迟。该SE结果表明,直接时间分辨响应观察晶体结构的重要性随着高速电脉冲场的应用,以了解Pb(Zr,Ti)O-3的铁电和压电反应的频率分散电影。

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  • 来源
    《Physical review, B》 |2019年第10期|共7页
  • 作者单位

    Tokyo Inst Technol Dept Innovat &

    Engn Mat Yokohama Kanagawa 2268503 Japan;

    Tokyo Inst Technol Mat Res Ctr Element Strategy Yokohama Kanagawa 2268503 Japan;

    Tokyo Inst Technol Lab Mat &

    Struct Yokohama Kanagawa 2268503 Japan;

    Tokyo Inst Technol Dept Innovat &

    Engn Mat Yokohama Kanagawa 2268503 Japan;

    Tokyo Inst Technol Dept Innovat &

    Engn Mat Yokohama Kanagawa 2268503 Japan;

    Tokyo Inst Technol Dept Innovat &

    Engn Mat Yokohama Kanagawa 2268503 Japan;

    Tokyo Inst Technol Dept Innovat &

    Engn Mat Yokohama Kanagawa 2268503 Japan;

    Univ New South Wales Sch Mat Sci &

    Engn Sydney NSW 2052 Australia;

    Nagoya Univ Dept Energy Engn Nagoya Aichi 4648603 Japan;

    Japan Synchrotron Radiat Res Inst JASRI 1-1-1 Kouto Sayo Hyogo 6795198 Japan;

    Natl Inst Mat Sci Synchrotron Xray Grp SPring 8 1-1-1 Kouto Sayo Hyogo 6795148 Japan;

    Univ New South Wales Sch Mat Sci &

    Engn Sydney NSW 2052 Australia;

    Tokyo Inst Technol Dept Innovat &

    Engn Mat Yokohama Kanagawa 2268503 Japan;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 固体物理学;
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