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An efficient algorithm for extracting the magnitude of the measurement error for fractional dynamics

机译:一种提取分数动力学测量误差幅度的高效算法

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摘要

Modern live-imaging fluorescent microscopy techniques following the stochastic motion of labeled tracer particles, i.e. single particle tracking (SPT) experiments, have uncovered significant deviations from the laws of Brownian motion in a variety of biological systems. Accurately characterizing the anomalous diffusion for SPT experiments has become a central issue in biophysics. However, measurement errors raise difficulty in the analysis of single trajectories. In this paper, we introduce a novel surface calibration method based on a fractionally integrated moving average (FIMA) process as an effective tool for extracting both the magnitude of the measurement error and the anomalous exponent for autocorrelated processes of various origins. This method is developed using a toy model - fractional Brownian motion disturbed by independent Gaussian white noise - and is illustrated on both simulated and experimental biological data. We also compare this new method with the mean-squared displacement (MSD) technique, extended to capture the measurement noise in the toy model, which shows inferior results. The introduced procedure is expected to allow for more accurate analysis of fractional anomalous diffusion trajectories with measurement errors across different experimental fields and without the need for any calibration measurements.
机译:标记示踪剂颗粒的随机运动之后的现代活成像荧光显微镜技术,即单粒跟踪(SPT)实验,从各种生物系统中发现了与布朗运动规律的显着偏差。精确地表征SPT实验的异常扩散已成为生物物理学的核心问题。然而,测量误差在分析单个轨迹的分析中提高了困难。在本文中,我们介绍了一种基于分馏的综合移动平均(FIMA)过程的新型表面校准方法,作为提取测量误差的大小和各种起源的自相关过程的异常指数的有效工具。该方法是使用由独立高斯白噪声干扰的玩具模型 - 分数褐色运动 - 并在模拟和实验生物数据上进行说明。我们还将这种新方法与平均平衡位移(MSD)技术进行了比较,扩展以捕获玩具模型中的测量噪声,显示出较差的结果。预计介绍的程序将允许更准确地分析不同实验领域的测量误差的分数异常扩散轨迹,而无需任何校准测量。

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  • 作者单位

    Wroclaw Univ Sci &

    Technol Fac Pure &

    Appl Math Hugo Steinhaus Ctr Wyspianskiego 27 PL-50370 Wroclaw Poland;

    Inst Curie Genet &

    Dev Biol Dept Paris France;

    Wroclaw Univ Sci &

    Technol Fac Pure &

    Appl Math Hugo Steinhaus Ctr Wyspianskiego 27 PL-50370 Wroclaw Poland;

    Wroclaw Univ Sci &

    Technol Fac Pure &

    Appl Math Hugo Steinhaus Ctr Wyspianskiego 27 PL-50370 Wroclaw Poland;

    Wroclaw Univ Sci &

    Technol Fac Pure &

    Appl Math Hugo Steinhaus Ctr Wyspianskiego 27 PL-50370 Wroclaw Poland;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 物理学;化学;
  • 关键词

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